| Name | Description | Rows | Columns | Tags |
| Distillation tower | Snapshot measurements on 27 variables from a distillation column; measured over 2.5 years. | 253 | 27 | multivariateoutliersregression |
| LDPE | Data from a low-density polyethylene production process. There are 14 process variables and 5 quality variables (last 5 columns). | 54 | 19 | multivariateoutliersmonitoring |
| Silicon wafer thickness | Thickness of a single wafer, measured at 9 locations for 184 consecutive batches. A single wafer is removed from a tray of wafers (always at the same position for each batch of wafers) after the chemical vapour decomposition process is complete. | 184 | 9 | multivariateoutliers |